Description: Minimum booking hours: 12 hours, Single Crystal X-ray Diffractometer, Sample characterizing temperature Range: 80 K – 400 K, Measurement: Crystal structure determination.
The instrument is used to measure single crystal XRD data at various temperature (80 K – 400 K) using liquid nitrogen. Detector distance can be changed depending on the requirement (crystal size 0.3 to 0.5 mm).
Specifications
Sealed tube anode, Molybdenum source
Maximum operating power: 40 kV 30 mA
Collimator diameter 0.35 mm
Oxford liquid nitrogen cryostat with temperature controller
Detector: CCD detector (Apex II)
4-axis goniometer